Статья: К теории исследования всплеска фототока собственного фоторезистора при продольной и поперечной облученности (2018)

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Comparative analysis of splash of intrinsic photoconductivity of semiconductors with increasing concentration of recombination centers has been analyzed at low-level uniform and nonuniform illumination along of the electric field. Equation describing distribution of concentration of nonequilibrium charge carriers has been derived outside approximation of quasi-neutrality for arbitrary light beam profile along of the electric field. It follows from equation that due to photoinduced space charge, the splash of photoelectric gain in photoconductors under illumination perpendicular and along of the electric field should differ significantly at any conditions of recombination on current contacts. If photogeneration of charge carriers is nonuniform, then, unlike uniform photogeneration, the splash of photoelectric gain depends on the polarity of applied voltage. Note, that approximation of quasi-neutrality is insensitive to polarity. An analytical expression is derived for maximum value of electron photoelectric gain depended on concentration of recombination centers in the case of exponential photogeneration profile and sweep-out effect on contacts. Found relation between concentrations of nonequilibrium electrons and holes allows deriving an analytical expression for maximum value of hole photoelectric gain.

Comparative analysis of splash of intrinsic photoconductivity of semiconductors with increasing concentration of recombination centers has been analyzed at low-level uniform and nonuniform illumination along of the electric field. Equation describing distribution of concentration of nonequilibrium charge carriers has been derived outside approximation of quasi-neutrality for arbitrary light beam profile along of the electric field. It follows from equation that due to photoinduced space charge, the splash of photoelectric gain in photoconductors under illumination perpendicular and along of the electric field should differ significantly at any conditions of recombination on current contacts. If photogeneration of charge carriers is nonuniform, then, unlike uniform photogeneration, the splash of photoelectric gain depends on the polarity of applied voltage. Note, that approximation of quasi-neutrality is insensitive to polarity. An analytical expression is derived for maximum value of electron photoelectric gain depended on concentration of recombination centers in the case of exponential photogeneration profile and sweep-out effect on contacts. Found relation between concentrations of nonequilibrium electrons and holes allows deriving an analytical expression for maximum value of hole photoelectric gain.

Ключевые фразы: невырожденный полупроводник с глубокими уровнями, неравновесные носители заряда, слабая межзонная однородная и неоднородная фотогенерация носителей, примесная рекомбинация, времена жизни электронов и дырок, фотоэлектрический коэффициент усиления
Автор (ы): Холоднов Вячеслав Александрович
Журнал: УСПЕХИ ПРИКЛАДНОЙ ФИЗИКИ

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Идентификаторы и классификаторы

SCI
Физика
УДК
621.383.4. Фотоэлементы с внутренним фотоэффектом. Фоторезисторы
eLIBRARY ID
36690438
Для цитирования:
ХОЛОДНОВ В. А. К ТЕОРИИ ИССЛЕДОВАНИЯ ВСПЛЕСКА ФОТОТОКА СОБСТВЕННОГО ФОТОРЕЗИСТОРА ПРИ ПРОДОЛЬНОЙ И ПОПЕРЕЧНОЙ ОБЛУЧЕННОСТИ // УСПЕХИ ПРИКЛАДНОЙ ФИЗИКИ. 2018. ТОМ 6, №6
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